• DocumentCode
    1257811
  • Title

    Introduction to the Special Issue on the 2009 International Reliability Physics Symposium

  • Author

    Stathis, J. H. ; Suehle, John H. ; Lacoe, Ronald C. ; Moore, Thomas M.

  • Volume
    9
  • Issue
    4
  • fYear
    2009
  • Firstpage
    508
  • Lastpage
    508
  • Abstract
    The three articles in this special section were presented at the 2009 International Reliability Physics Symposium.
  • Keywords
    Dielectric devices; Integrated circuit interconnections; Integrated circuit reliability; Mechanical factors; Microelectronics; Nanoporous materials; Physics; Semiconductor device reliability; Special issues and sections; Thin film transistors;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2009.2033405
  • Filename
    5310823
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1257811