DocumentCode :
1257916
Title :
Particle-in-cell plus direct simulation Monte Carlo (PIC-DSMC) approach for self-consistent plasma-gas simulations
Author :
Serikov, Vladimir V. ; Kawamoto, Shinji ; Nanbu, Kenichi
Author_Institution :
Nippon Sheet Glass Co. Ltd., Chiba, Japan
Volume :
27
Issue :
5
fYear :
1999
fDate :
10/1/1999 12:00:00 AM
Firstpage :
1389
Lastpage :
1398
Abstract :
The particle-in-cell (PIC) and direct simulation Monte Carlo (DSMC) approaches have been combined into a PIC-DSMC model for self-consistent simulations of low-temperature collisional plasmas and the background gas. This novel approach is based on the weighting collision simulation scheme allowing for disparate number densities and time scales of different species. The applicability of the developed algorithm is illustrated by simulations of one-dimensional direct current and two-dimensional magnetron sputtering discharges in argon. An appreciable effect of the energetic discharge species on the density, temperature, and flow field of the background gas shows the importance of the coupled plasma-gas simulation for such technologies as sputtering, dry etching, plasma enhanced vapor deposition, etc
Keywords :
Monte Carlo methods; plasma CVD; plasma materials processing; plasma simulation; plasma-wall interactions; sputter etching; sputtering; Ar; algorithm; background gas; density; disparate number densities; dry etching; flow field; low-temperature collisional plasmas; one-dimensional direct current; particle-in-cell plus direct simulation Monte Carlo approach; plasma enhanced vapor deposition; self-consistent plasma-gas simulations; sputtering; temperature; two-dimensional magnetron sputtering discharges; weighting collision simulation scheme; Argon; Chemical vapor deposition; Monte Carlo methods; Plasma applications; Plasma density; Plasma materials processing; Plasma properties; Plasma simulation; Plasma temperature; Sputtering;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.799817
Filename :
799817
Link To Document :
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