• DocumentCode
    1258184
  • Title

    Spin-valve heads with self-stabilized free layer by antiferromagnet

  • Author

    Mao, Sining ; Gao, Zheng ; Xi, Haiwen ; Kolbo, Paul ; Plumer, Martin ; Wang, Lei ; Goyal, Anuja ; Jin, Insik ; Chen, Jian ; Hou, Chunhong ; White, R.M. ; Murdock, Ed

  • Author_Institution
    Seagate Technol., Bloomington, MN, USA
  • Volume
    38
  • Issue
    1
  • fYear
    2002
  • Firstpage
    26
  • Lastpage
    31
  • Abstract
    We demonstrate the feasibility of a spin-valve read head using an adjacent antiferromagnetic (AFM) layer to provide a stabilization Held, eliminating the hard bias permanent magnet layer. The head stack consists of seed/AFM/CoFe/Ru/CoFe/Cu/CoFe (and/or NiFe)/Cu/IrMn/cap where the AFM is PtMn or IrMn. The abutted junction is about 0.1 μm wide at the free layer and no permanent magnet materials are used. Micromagnetic modeling indicates that a proper bias field is needed to have a stable head response. The bias field from the AFM layer can be modified by a nonmagnetic spacer layer between AFM and FM. The coupling field decays exponentially with the thickness of the spacer layer, consistent with a pinhole-dominated mechanism. Unshielded sensors show much higher sensitivity as,compared with a standard PM abutted junction head. Microtrack profile based on the spin-stand test shows a regular shape without apparent lumps. The electrical reader width is about 6 μ" (0.15 μm), corresponding to a track density of 112 ktpi. Combined with a linear density of 591 kbpi the heads in this work are capable of areal density around 66 Gb/in2.
  • Keywords
    antiferromagnetism; giant magnetoresistance; magnetic heads; spin valves; 0.1 micron; 0.15 micron; CoFe-Ru-CoFe-Cu-CoFe-Cu-IrMn; CoFe/Ru/CoFe/Cu/CoFe/Cu/IrMn; adjacent antiferromagnetic layer; bias field; electrical reader width; micromagnetic modeling; nonmagnetic spacer layer; pinhole-dominated mechanism; read head; self-stabilized free layer; spin-stand test; spin-valve heads; stabilization field; track density; Antiferromagnetic materials; Helium; Magnetic heads; Magnetic materials; Magnetic memory; Magnetoresistance; Micromagnetics; Permanent magnets; Shape; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.988906
  • Filename
    988906