A study of high-frequency characteristics of write heads with the ac-phase high-frequency magnetic force microscope

Author

Abe, Masayuki ; Tanaka, Yoichiro

Author_Institution

Core Technol. Center, Toshiba Corp., Tokyo, Japan

Volume

38

Issue

1

fYear

2002

Firstpage

45

Lastpage

49

Abstract

We demonstrate frequency characteristic measurement methods of write head with an ac-phase high-frequency magnetic force microscope (HF-MFM). Two measurement methods allow separating the characteristics into electrical ones including the head amplifier and/or interconnects and magnetic ones including head materials. The high spatial resolution ac-phase HF-MFM allows resolving the distribution change of the HF magnetic field with frequency. The relation between HF-MFM and spin-stand data was also investigated. It is thought that HF-MFM measurements can be applied to head performance test before HDD manufacturing.

Keywords

characteristics measurement; magnetic force microscopy; magnetic heads; ac-phase high-frequency magnetic force microscope; distribution change; frequency characteristic measurement methods; head amplifier; head materials; high-frequency characteristics; performance test; spin-stand data; write heads; Electric variables measurement; Force measurement; Frequency measurement; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic materials; Magnetic separation; Spatial resolution;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2002.988909

Filename

988909