Title :
A study of high-frequency characteristics of write heads with the ac-phase high-frequency magnetic force microscope
Author :
Abe, Masayuki ; Tanaka, Yoichiro
Author_Institution :
Core Technol. Center, Toshiba Corp., Tokyo, Japan
Abstract :
We demonstrate frequency characteristic measurement methods of write head with an ac-phase high-frequency magnetic force microscope (HF-MFM). Two measurement methods allow separating the characteristics into electrical ones including the head amplifier and/or interconnects and magnetic ones including head materials. The high spatial resolution ac-phase HF-MFM allows resolving the distribution change of the HF magnetic field with frequency. The relation between HF-MFM and spin-stand data was also investigated. It is thought that HF-MFM measurements can be applied to head performance test before HDD manufacturing.
Keywords :
characteristics measurement; magnetic force microscopy; magnetic heads; ac-phase high-frequency magnetic force microscope; distribution change; frequency characteristic measurement methods; head amplifier; head materials; high-frequency characteristics; performance test; spin-stand data; write heads; Electric variables measurement; Force measurement; Frequency measurement; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic materials; Magnetic separation; Spatial resolution;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.988909
