Title :
Thickness and Refractive Index Measurements by Full-Field Optical Coherence Microscopy
Author :
Na, Jihoon ; Choi, Woo June ; Choi, Hae Young ; Ryu, Seon Young ; Choi, Eun Seo ; Lee, Byeong Ha
Author_Institution :
Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
Abstract :
We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a flat glass plate and high-resolution depth resolved en-face images were taken. With adopting the reference plane from a cross-sectional image, the physical thickness, and the refractive index distribution could be obtained.
Keywords :
optical microscopy; polymers; refractive index measurement; thickness measurement; epoxy; flat glass plate; full-field optical coherence microscopy; high-resolution depth resolved en-face images; physical thickness; refractive index measurements; thickness measurements; Biomedical optical imaging; Nonlinear optics; Optical films; Optical interferometry; Optical microscopy; Optical refraction; Optical sensors; Optical variables control; Refractive index; Thickness measurement; Full-field optical coherence microscopy (FF-OCM); medical imaging equipment; refractive index measurement;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2009.2031808
