Thickness and Refractive Index Measurements by Full-Field Optical Coherence Microscopy

Author

Na, Jihoon ; Choi, Woo June ; Choi, Hae Young ; Ryu, Seon Young ; Choi, Eun Seo ; Lee, Byeong Ha

Author_Institution

Gwangju Inst. of Sci. & Technol., Gwangju, South Korea

Volume

9

Issue

12

fYear

2009

Firstpage

1996

Lastpage

1997

Abstract

We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a flat glass plate and high-resolution depth resolved en-face images were taken. With adopting the reference plane from a cross-sectional image, the physical thickness, and the refractive index distribution could be obtained.

Keywords

optical microscopy; polymers; refractive index measurement; thickness measurement; epoxy; flat glass plate; full-field optical coherence microscopy; high-resolution depth resolved en-face images; physical thickness; refractive index measurements; thickness measurements; Biomedical optical imaging; Nonlinear optics; Optical films; Optical interferometry; Optical microscopy; Optical refraction; Optical sensors; Optical variables control; Refractive index; Thickness measurement; Full-field optical coherence microscopy (FF-OCM); medical imaging equipment; refractive index measurement;

fLanguage

English

Journal_Title

Sensors Journal, IEEE

Publisher

ieee

ISSN

1530-437X

Type

jour

DOI

10.1109/JSEN.2009.2031808

Filename

5310958