Title :
Metamorphic graded bandgap InGaAs-InGaAlAs-InAlAs double heterojunction p-i-I-n photodiodes
Author :
Jang, Jae-Hyung ; Cueva, Gabriel ; Hoke, William E. ; Lemonias, P.J. ; Fay, Patrick ; Adesida, Ilesanmi
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fDate :
3/1/2002 12:00:00 AM
Abstract :
High-speed metamorphic double heterojunction photodiodes were fabricated on GaAs substrates for long-wavelength optical fiber communications. The high quality linearly graded quaternary InGaAlAs metamorphic buffer layer made possible the growth of excellent InGaAs-InGaAlAs-InAlAs heterostructures on GaAs substrates. The use of a novel double heterostructure employing an InGaAlAs optical impedance matching layer, a chirped InGaAs-InAlAs superlattice graded bandgap layer (SL-GBL), and a large bandgap i-InAlAs drift region enabled photodiodes to achieve a low dark current of 500 pA, a responsivity of 0.6 A/W, and a -3 dB bandwidth of 38 GHz at -5 V reverse bias for 1.55 μm light. The effect of accumulated charges at the InGaAs-InAlAs heterointerface was examined through a comparison of the dark currents of InGaAs-InAlAs and InGaAs-InP abrupt single heterojunction photodiodes; to photodiodes with chirped InGaAs-InAlAs SL-GBLs. The charge accumulation effects observed in abrupt heterojunction devices were suppressed by including a chirped InGaAs-InAlAs SL-GBL between the InGaAs absorption layer and InAlAs drift layer. The effect of passivation techniques was evaluated by comparing dark currents of unpassivated photodiodes and photodiodes passivated with either polyimide or SiNx. The enhancement of photodiode bandwidth through the inclusion of a transparent large bandgap I-InAlAs drift region was verified by comparing the bandwidths of the P-i-I-N photodiodes that have I-InAlAs between i-InGaAs photoabsorption layer and N+ InAlAs cathode to conventional P-i-N photodiodes without a drift region
Keywords :
III-V semiconductors; aluminium compounds; dark conductivity; energy gap; gallium arsenide; indium compounds; optical communication equipment; p-i-n photodiodes; semiconductor superlattices; 1.55 micron; 38 GHz; 500 pA; GaAs substrates; InAlAs cathode; InAlAs drift layer; InGaAlAs metamorphic buffer layer; InGaAlAs optical impedance matching layer; InGaAs absorption layer; InGaAs-InAlAs; InGaAs-InAlAs heterointerface; InGaAs-InGaAlAs-InAlAs; InGaAs-InGaAlAs-InAlAs double heterojunction p-i-I-n photodiodes; InGaAs-InGaAlAs-InAlAs heterostructures; InGaAs-InP; InGaAs-InP abrupt single heterojunction photodiodes; P-i-I-N photodiodes; P-i-N photodiodes; accumulation effects; chirped InGaAs-InAlAs; chirped InGaAs-InAlAs superlattice; dark currents; double heterostructure; drift region; graded bandgap layer; heterojunction devices; large bandgap drift region enabled photodiodes; long-wavelength optical fiber communications; low dark current; metamorphic graded bandgap photodiodes; passivation techniques; photodiode bandwidth; polyimide; responsivity; reverse bias; transparent large bandgap drift region; unpassivated photodiodes; Bandwidth; Buffer layers; Chirp; Dark current; Gallium arsenide; Heterojunctions; Indium compounds; Optical fiber communication; Photodiodes; Photonic band gap;
Journal_Title :
Lightwave Technology, Journal of