Dielectric response of different complex materials

Author

Nigmatullin, Raoul R. ; Zhang, Wei ; Baleanu, Dumitru

Author_Institution

Inst. of Phys., Kazan (Volga Region) Fed. Univ., Kazan, Russia

Volume

19

Issue

4

fYear

2012

fDate

8/1/2012 12:00:00 AM

Firstpage

1344

Lastpage

1350

Abstract

In this paper we describe novel results of the application of the non-orthogonal amplitude-frequency analysis of the smoothed signals (NAFASS) approach [1] for the analysis of the dielectric response of some complex materials. Our goal is to convince experimentalists that the NAFASS approach can serve as a useful tool in the cases when an underlying physical model is absent or in cases when it is necessary to calibrate the equipment with uncertain quantitative characteristics. The parameters obtained in the frame of the NAFASS approach can be used as metrological parameters for comparison of electromagnetic responses associated with properties of different dielectric materials.

Keywords

dielectric materials; dielectric measurement; NAFASS approach; complex materials; dielectric response; electromagnetic responses; metrological parameters; nonorthogonal amplitude-frequency analysis; smoothed signals; Dielectrics; Fitting; Frequency measurement; Materials; Scattering; Scattering parameters; Temperature measurement; Dielectric materials; dielectric measurements; methods of SN analysis;

fLanguage

English

Journal_Title

Dielectrics and Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

1070-9878

Type

jour

DOI

10.1109/TDEI.2012.6260010

Filename

6260010