DocumentCode :
1259154
Title :
Dielectric response of different complex materials
Author :
Nigmatullin, Raoul R. ; Zhang, Wei ; Baleanu, Dumitru
Author_Institution :
Inst. of Phys., Kazan (Volga Region) Fed. Univ., Kazan, Russia
Volume :
19
Issue :
4
fYear :
2012
fDate :
8/1/2012 12:00:00 AM
Firstpage :
1344
Lastpage :
1350
Abstract :
In this paper we describe novel results of the application of the non-orthogonal amplitude-frequency analysis of the smoothed signals (NAFASS) approach [1] for the analysis of the dielectric response of some complex materials. Our goal is to convince experimentalists that the NAFASS approach can serve as a useful tool in the cases when an underlying physical model is absent or in cases when it is necessary to calibrate the equipment with uncertain quantitative characteristics. The parameters obtained in the frame of the NAFASS approach can be used as metrological parameters for comparison of electromagnetic responses associated with properties of different dielectric materials.
Keywords :
dielectric materials; dielectric measurement; NAFASS approach; complex materials; dielectric response; electromagnetic responses; metrological parameters; nonorthogonal amplitude-frequency analysis; smoothed signals; Dielectrics; Fitting; Frequency measurement; Materials; Scattering; Scattering parameters; Temperature measurement; Dielectric materials; dielectric measurements; methods of SN analysis;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2012.6260010
Filename :
6260010
Link To Document :
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