• DocumentCode
    1259322
  • Title

    Magnetic properties and thermal stability of electroplated NiFeCr and NiFeMo films with high resistivity

  • Author

    Hoshino, K. ; Sano, M. ; Narumi, S. ; Fuyama, M.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Ibaraki, Japan
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    3433
  • Lastpage
    3435
  • Abstract
    The magnetic properties and resistivity of electroplated Ni45 Fe55 films with added Cr or Mo were investigated in order to obtain write head materials with high resistivity for high frequency (a few hundred MHz) regions. The high resistivity of 60 μΩ cm and high magnetic flux density of 1.5T were obtained when 1.5at% of Cr or Mo were added to electroplated Ni45Fe55 films. The thermal stability and corrosion resistance of NiFe(Cr, Mo) films were the same as those of NiFe films. Furthermore, domain structures of the NiFe and NiFeCr top write-head core were observed. The easy axis of annealed films easily switched towards the track width direction in the head-yoke geometry
  • Keywords
    annealing; chromium alloys; corrosion resistance; electrical resistivity; electroplated coatings; ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic cores; magnetic domains; magnetic heads; magnetic switching; magnetic thin films; molybdenum alloys; nickel alloys; soft magnetic materials; thermal stability; 1.5 T; 2 MHz; 60 muohmcm; NiFeCr; NiFeMo; NiFeMo films; annealed films; corrosion resistance; domain structures; easy axis; electroplated Ni45Fe55 films; electroplated NiFeCr film; head-yoke geometry; high frequency; high magnetic flux density; high resistivity; magnetic properties; resistivity; thermal stability; top write-head core; track width direction; write head materials; Chromium; Conductivity; Frequency; Iron; Magnetic films; Magnetic heads; Magnetic materials; Magnetic properties; Thermal resistance; Thermal stability;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800548
  • Filename
    800548