• DocumentCode
    1259459
  • Title

    The size estimation of the Bi-YIG nanoparticles dispersed in a plastic binder

  • Author

    Hirano, Temyoshi ; Namikawa, Tatsum

  • Author_Institution
    Toppan Printing Co. Ltd., Saitama, Japan
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    3487
  • Lastpage
    3489
  • Abstract
    Nano-size Bi1.8Y1.2Fe5O12 particles were prepared with a coprecipitation and heat treatment method. The coating films of the particles were prepared with coating techniques. The crystalline sizes of the Bi1.8Y1.2Fe5O12 particles were calculated using the Scherrer equation with the X-ray diffraction data. The calculated size of the 0 h milling particle is about 400 nm that is almost the same as the measured size with a transmission electron microscope. The calculated particle size after 100 h milling is about 50 nm that is almost the same as the measured size with an atomic force microscope. The size of the prepared Bi1.8Y1.2 Fe5O12 particles is changed with the milling process. The crystalline size calculation using the Scherrer equation with the X-ray diffraction data is a method of a size estimation of nano-size Bi1.8Y1.2Fe5O12 fine particles
  • Keywords
    X-ray diffraction; atomic force microscopy; bismuth compounds; coating techniques; garnets; heat treatment; machining; magnetic particles; nanostructured materials; nanotechnology; particle size; powder technology; transmission electron microscopy; yttrium compounds; 100 h; 400 nm; 50 nm; AFM; Bi-YIG; Bi1.8Y1.2Fe5O12; Scherrer equation; TEM; X-ray diffraction data; YFe5O12:Bi; YIG:Bi; atomic force microscopy; coating films; coprecipitation; heat treatment; milling process effects; milling time dependence; nanoparticles size estimation; particle dispersion; plastic binder; transmission electron microscopy; Bismuth; Coatings; Crystallization; Equations; Iron; Milling; Nanoparticles; Particle measurements; Size measurement; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800566
  • Filename
    800566