Title :
Two-Dimensional Analytical Drain Current Model for Double-Gate MOSFET Incorporating Dielectric Pocket
Author :
Kumari, Vandana ; Saxena, Manoj ; Gupta, R.S. ; Gupta, Mridula
Author_Institution :
Dept. of Electron. Sci., Univ. of Delhi, New Delhi, India
Abstract :
In this paper, a dielectric-pocket double-gate MOSFET is described for low-voltage low-power applications. A complete drain current model has been developed including the channel length modulation effect. The analytical results have been validated by comparing them with the simulation results using the ATLAS 3-D device simulator. This paper analyzes the impact of dielectric pillars on large-signal performance metrics in terms of linearity and digital performance. Due to high Ion/Ioff ratio, device gain, and extremely low value of intrinsic delay and power dissipation, the proposed design is a suitable candidate for low-voltage low-power digital and analog applications.
Keywords :
MOSFET; low-power electronics; semiconductor device models; ATLAS 3D device simulator; channel length modulation effect; dielectric pillars; dielectric-pocket double-gate MOSFET; intrinsic delay value; large-signal performance metrics; low-voltage low-power analog applications; low-voltage low-power digital applications; power dissipation; two-dimensional analytical drain current model; Analytical models; Electric potential; Linearity; Logic gates; MOSFET circuits; Performance evaluation; Semiconductor device modeling; ATLAS 3-D; dielectric pocket (DP); double gate (DG); inverter;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2012.2206030