• DocumentCode
    1260197
  • Title

    Measurements and modeling of hysteresis in magnetic materials under the action of an orthogonal bias field

  • Author

    Bi, Y. ; Jiles, D.C.

  • Author_Institution
    Ames Lab., Iowa State Univ., Ames, IA, USA
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    3787
  • Lastpage
    3789
  • Abstract
    The effect of an orthogonal dc bias field on hysteresis in isotropic magnetic materials under the action of an ac exciting field was investigated. The experimental results indicated that the orthogonal field rotated the hysteresis loops on the BH plane and reduced the enclosed area. As a result, the effective permeability, hysteresis loss, coercivity and remanence decreased with increasing orthogonal bias field. By including the orthogonal field in the anhysteretic model equation and incorporating a variable reversibility coefficient, the Jiles-Atherton hysteresis model was extended to describe the behavior of magnetic materials under the action of an orthogonal bias field. Using finite element modeling for evaluating the effective internal orthogonal field, the modeled hysteresis curve showed quantitative agreement with experimental results
  • Keywords
    coercive force; finite element analysis; magnetic hysteresis; magnetic permeability; magnetic variables measurement; remanence; BH plane; Jiles-Atherton hysteresis model; ac exciting field; anhysteretic model equation; coercivity; effective permeability; finite element modeling; hysteresis loops; hysteresis loss; hysteresis measurement; hysteresis modelling; isotropic magnetic materials; orthogonal dc bias field; remanence; variable reversibility coefficient; Anisotropic magnetoresistance; Bismuth; Coercive force; Coils; Magnetic field measurement; Magnetic hysteresis; Magnetic materials; Magnetic properties; Permeability; Remanence;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800665
  • Filename
    800665