• DocumentCode
    1260439
  • Title

    Annealing effect on microstructure and asymmetric giant magnetoimpedance in Co-based amorphous ribbon

  • Author

    Jang, Kil Jae ; Kim, Cheol Gi ; Yoon, Seok Soo ; Shin, Kyung Ho

  • Author_Institution
    Dept. of Phys., Sun Moon Univ., Chungnam, South Korea
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    3889
  • Lastpage
    3891
  • Abstract
    We investigated the modification of microstructure and the change in GMI profile in a weak field-annealed amorphous ribbon as a function of the annealing time. The FWHM of x-ray diffraction patterns decreased in 8 h annealed samples, suggesting the reduction of the amorphous phase in the surface layer. Auger electron spectroscopy represented the compositional depth profile, where the oxide layer was heavily enriched in B and Si contents, balanced by a depletion of these elements in the underlying materials. The reduction of B and Si content decreases the crystallization temperature of the depletion layer, resulting in the formation of crystal or crystallites during annealing in air. The sharp change of GMI profiles was observed for the annealed samples over 1 h, but there was hysteresis in the GMI profile for increasing and decreasing field for the 1 h annealed sample. As the annealing time increased, the peak in the antiparallel field region to annealing field disappeared. Eventually, the GMI-valve in parallel field region was revealed in a 8 h annealed sample
  • Keywords
    Auger electron spectra; X-ray diffraction; amorphous magnetic materials; annealing; cobalt alloys; crystallisation; electric impedance; giant magnetoresistance; Auger electron spectroscopy; X-ray diffraction; amorphous ribbon; annealing; asymmetric giant magnetoimpedance; crystallization temperature; depth profile; microstructure; Amorphous materials; Annealing; Composite materials; Crystalline materials; Crystallization; Electrons; Microstructure; Phase change materials; Spectroscopy; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800698
  • Filename
    800698