DocumentCode
1260572
Title
Accurate Analytical Model for Single Event (SE) Crosstalk
Author
Liu, Baojun ; Cai, Li ; Zhu, Jing
Author_Institution
Department of Electronic Science and Technology, Science Institute, Air Force Engineering University, Xi´´An, China
Volume
59
Issue
4
fYear
2012
Firstpage
1621
Lastpage
1627
Abstract
With advances in modern technology, circuits become more sensitive to single event transient (SET) due to decreased device feature size and increased coupling effects among interconnects, which might cause SET to affect multiple logic paths. This paper proposed an accurate and efficient SE crosstalk estimation model based on point admittance and equivalent circuit of SET. The proposed model uses a 6-node template circuit of interconnect and simplifies the calculation by use of point admittance. By use of Taylor series expansion theorem, the analytical expressions of noise peak voltage and pulse width are obtained. The waveform of SE crosstalk in the analytical model is very good in agreement with SPICE. Results from 1000 random cases show that by comparison with previous works, the model has a significant improved accuracy with an average error of only 3.07% in noise peak voltage, and 8.11% in pulse width, respectively. These results validate that the analytical model is efficient and accurate.
Keywords
Admittance; Analytical models; Capacitance; Crosstalk; Equivalent circuits; Integrated circuit modeling; Noise; Analytical model; equivalent circuit; point admittance; single event crosstalk;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2204901
Filename
6262458
Link To Document