DocumentCode :
1260588
Title :
High precision magnetostriction measurement employing the B-H looper bending method
Author :
Choe, G. ; Megdal, B.
Author_Institution :
Quantum Corp., Shrewsbury, MA, USA
Volume :
35
Issue :
5
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
3959
Lastpage :
3961
Abstract :
We report a simple, nondestructive B-H looper bending method for measuring 10-7 of magnetostriction (λ) in thin films (~150 Å). The new method improves the accuracy and repeatability of ΔHk measurements in loopers by employing a measurement sequence that corrects the non-repeatable balance errors. For the 150 Å thick NiFe films under an anisotropic strain of 4.6×10-5, we achieved a ΔHk repeatability, 1σ=0.009 Oe which is equivalent to 3.4×10-8 in λ. Our technique gives λ values that agree well with the optical cantilever bending technique and can be easily utilized in a thin-film head production environment for accurate control of λ
Keywords :
Permalloy; bending; magnetic anisotropy; magnetic heads; magnetic thin films; magnetic variables measurement; magnetostriction; 150 angstrom; B-H looper bending method; Helmholtz coil method; NiFe; Permalloy; accurate magnetostriction control; anisotropic strain; anisotropy change; balance errors correction; high precision magnetostriction measurement; nondestructive method; recording head materials; repeatability; thin films; thin-film head production environment; Anisotropic magnetoresistance; Error correction; Geometrical optics; Magnetic field induced strain; Magnetic heads; Magnetostriction; Optical control; Optical films; Production; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.800721
Filename :
800721
Link To Document :
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