Comparison of magnetic images using point and thin-film magnetic force microscopy tips

Author

Liou, S.H.

Author_Institution

Dept. of Phys. & Astron., Nebraska Univ., Lincoln, NE, USA

Volume

35

Issue

5

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

3989

Lastpage

3991

Abstract

The magnetic images of a magnetic reference sample were compared using point and thin-film magnetic force microscopy (MFM) tips. The thin film MFM tip was made by magnetron sputtering of an amorphous metal. The point MFM tip was made by an ion milling process that produces a small magnetic particle on the cantilever. Our results clearly demonstrated that the volume of magnetic material involved in the tip-sample interaction is much reduced in the case of the point tip compared to that of the thin film tips. By comparing the magnetic images of a tri-bit pattern on a magnetic reference sample, we observed an improved resolution using a point MFM tip

Keywords

ion beam assisted deposition; magnetic force microscopy; magnetic thin film devices; sputter deposition; ion milling process; magnetic force microscopy tips; magnetic images; magnetron sputtering; point MFM tips; resolution; thin-film MFM tips; tip-sample interaction; tri-bit pattern; Amorphous magnetic materials; Amorphous materials; Image resolution; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic materials; Magnetic particles; Milling; Sputtering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.800731

Filename

800731