• DocumentCode
    1261147
  • Title

    Cavity coupling structure for planar oscillators showing DR-like reflective characteristics

  • Author

    Kim, N. ; Kwon, Y.

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    2/28/2002 12:00:00 AM
  • Firstpage
    210
  • Lastpage
    211
  • Abstract
    A new cavity coupling structure has been developed for low-phase noise oscillator applications. Unlike the conventional cavity coupling structures that show absorption at the resonant frequency, the new structure shows high reflection at resonance similar to dielectric resonators, making it suitable for the reflective oscillators. The fabricated cavity resonator showed a loaded Q-factor of 1200 and the X-band oscillator using the new resonator showed phase noise proper-ties of -57 and -83 dBc/Hz at 1 and 10 kHz offset, respectively. This is comparable to the best results of dielectric resonator oscillators using HEMTs at this frequency range
  • Keywords
    HEMT circuits; cavity resonators; circuit stability; electron device noise; microwave oscillators; phase noise; waveguide couplers; 1 kHz; 1 kHz offset; 10 kHz; 10 kHz offset; HEMT oscillator stability; X-band oscillator; absorption; cavity coupling structure; dielectric resonators; loaded Q-factor 1200; phase noise; planar oscillators; reflection; reflective oscillators; resonance;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20020170
  • Filename
    990199