Performance comparison of a class of multi-level DFE and PRML detectors in the presence of channel nonlinearities

Author

Indukumar, K.C. ; Gopalaswamy, Srini ; Liu, Bin ; Lee, Y.X.

Author_Institution

Data Storage Inst., Singapore

Volume

35

Issue

5

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

2283

Lastpage

2285

Abstract

Nonlinear transition shift (NLTS) and partial erasure (PE) are two channel nonlinearities that degrade bit-error-rate (BER) performance of detectors at high densities. In this paper, we compare BER performances of partial response maximum-likelihood (PRML) detectors developed for (0, k) run-length-limited (RLL) coded channels with multi-level DFE (MDFE) family detectors at different levels of nonlinearity. Bit-by-bit simulations indicate that the MDFE family detectors are relatively robust to NLTS and PE compared to the PRML detectors. Results also show that the M3DFE detector, an advanced detector in the MDFE family, outperforms the other detectors at high densities under channel nonlinearities

Keywords

decision feedback equalisers; digital simulation; error statistics; magnetic recording; magnetic sensors; partial response channels; (0, k) run-length-limited coded channels; BER performance; M3DFE detector; MDFE detectors; PRML detectors; bit-by-bit simulations; channel nonlinearities; degrade bit-error-rate performance; high densities; magnetic recording; multi-level DFE detectors; nonlinear transition shift; partial erasure; partial response maximum-likelihood detectors; performance comparison; Bit error rate; Corporate acquisitions; Degradation; Detectors; Instruments; Magnetic recording; Magnetization; Maximum likelihood detection; Memory; Robustness;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.800800

Filename

800800