Title :
Read channels for patterned media
Author :
Hughes, Gordon F.
Author_Institution :
Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA
fDate :
9/1/1999 12:00:00 AM
Abstract :
Patterned media may alleviate thermal decay and transition noise limits on the horizon for conventional continuous film media. A system analysis of oriented patterned media for magnetic recording is presented. Gbit/sec read channels for vertical and horizontal easy axis patterned media are analyzed at 100 Gb/in2. Encouraging bit error rates of 10-9 are predicted by channel simulation using recording physics read pulses and electronic and patterning lithography noise
Keywords :
lithography; magnetic recording noise; Gbit/sec read channels; bit error rates; channel simulation; continuous film media; horizontal easy axis patterned media; lithography noise; magnetic recording; patterned media; read channels; recording physics read pulses; system analysis; thermal decay; transition noise limits; vertical easy axis patterned media; Bit error rate; Lithography; Magnetic analysis; Magnetic films; Magnetic noise; Magnetic recording; Pattern analysis; Perpendicular magnetic recording; Physics; Predictive models;
Journal_Title :
Magnetics, IEEE Transactions on
