Title :
Wear of the MR head in helical-scanning tape systems
Author :
Kamatani, Yoshiteru ; Nagai, Nobuyuki ; Kondo, Masayuki ; Ozue, Tadashi ; Onodera, Seiichi ; Onoe, Seiji
Author_Institution :
CT Dev. Center, Sony Corp., Yokohama, Japan
fDate :
9/1/1999 12:00:00 AM
Abstract :
In high-density recording in helical-scanning tape systems, MR head-wear caused by contact between the head and the tape is a critical item. We examine a method of measuring MR head-wear which can be calculated in terms of MR head resistance. We then compare wear as determined by the micro-indentation technique and this method. We then use this measuring method to investigate MR head-wear and gap recession depth using a variety of tapes. We found that by optimizing the asperity of advanced ME tape with a protective layer, MR head-wear can be reduced
Keywords :
abrasion; magnetic heads; magnetic tape equipment; magnetoresistive devices; MR head; asperity; gap recession depth; head resistance; helical-scanning tape systems; high-density recording; micro-indentation technique; protective layer; wear; Electrical resistance measurement; Magnetic cores; Magnetic devices; Magnetic heads; Magnetic recording; Optical recording; Temperature dependence; Temperature measurement; Testing; Thin film sensors;
Journal_Title :
Magnetics, IEEE Transactions on
