• DocumentCode
    1261592
  • Title

    Normal incidence polarization interferometer for measuring flying height of magnetic heads

  • Author

    Liu, Xinqun ; Clegg, Warwick ; Liu, Bo

  • Author_Institution
    Centre for Res. in Inf. Storage Technol., Plymouth Univ., UK
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    2457
  • Lastpage
    2459
  • Abstract
    In this paper, we give a brief review and analysis to the two currently most powerful methods for flying height testing of magnetic heads-intensity interferometry and polarization interferometry. Then a dual-beam normal incidence polarization interferometry method is proposed to compromise the disadvantages of the above two methods. The proposed method not only has the advantages of both the above methods, but also can be used to measure the pitch and roll of the head-slider dynamically. Design details and analysis of the relationship between the optical parameters of the tester and its testing accuracy are given
  • Keywords
    disc drives; height measurement; light interferometers; light interferometry; light polarisation; magnetic heads; dual-beam polarization interferometry method; flying height measurement; head-slider pitch; head-slider roll; magnetic heads; normal incidence polarization interferometer; tester optical parameters; testing accuracy; Glass; Magnetic analysis; Magnetic heads; Manufacturing industries; Memory; Optical interferometry; Optical refraction; Optical variables control; Polarization; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800857
  • Filename
    800857