Title :
Online testing approach for very deep-submicron ICs
Author :
Favalli, Michele ; Metra, Cecilia
Author_Institution :
Dept. of Eng., Ferrara Univ., Italy
Abstract :
Very deep-submicron technologies pose new challenges to IC testing. In particular, crosstalk and transient faults are difficult to detect with traditional methods. Online testing techniques can detect these faults, however, and a new approach extends these techniques to include gross-delay faults. Moreover, this approach described by the authors can be exploited to detect stuck-at and bridging faults offline
Keywords :
VLSI; automatic testing; crosstalk; delays; fault location; integrated circuit testing; logic testing; timing; IC testing; bridging faults; crosstalk faults; gross-delay faults; online testing technique; stuck-at faults; transient faults; very deep-submicron ICs; Circuit faults; Circuit testing; Coupling circuits; Crosstalk; Delay; Electrical fault detection; Fault detection; Integrated circuit testing; Timing; Uncertainty;
Journal_Title :
Design & Test of Computers, IEEE
