DocumentCode :
1261848
Title :
Effect of stress induced anisotropy on SAL-biased MR head performance
Author :
Choe, G. ; Wu, A. ; Gocemen, F. ; Johns, E.
Author_Institution :
Quantum Corp., Shrewsbury, MA, USA
Volume :
35
Issue :
5
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
2565
Lastpage :
2567
Abstract :
The effect of magnetostriction (MS) on the device characteristics of soft-adjacent-layer (SAL) biased magnetoresistive (MR) head was investigated. As MS changes from -7×10-7 to 1.77×10-6, the magnetic track width increases from 1.26 to 1.83 μm. Asymmetry of bias point, output sensitivity, and output amplitude are also affected by the stress induced anisotropy. The variation of magnetostriction (Δλ=2×10-6) induces the change in bias field by 60 Oe associated with the estimated stress of +800 MPa on the MR stripe
Keywords :
induced anisotropy (magnetic); magnetic heads; magnetoresistive devices; magnetostriction; 1.26 to 1.83 micron; MR stripe; SAL-biased MR head; bias field; bias point; magnetic track width; magnetostriction; output amplitude; output sensitivity; soft-adjacent-layer; stress induced anisotropy; Anisotropic magnetoresistance; Insulation life; Magnetic anisotropy; Magnetic devices; Magnetic heads; Magnetic sensors; Magnetostriction; Perpendicular magnetic anisotropy; Residual stresses; Saturation magnetization;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.800892
Filename :
800892
Link To Document :
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