DocumentCode :
1261852
Title :
Nonparametric Scene Parsing via Label Transfer
Author :
Liu, Ce ; Yuen, Jenny ; Torralba, Antonio
Author_Institution :
Microsoft Res. New England, Cambridge, MA, USA
Volume :
33
Issue :
12
fYear :
2011
Firstpage :
2368
Lastpage :
2382
Abstract :
While there has been a lot of recent work on object recognition and image understanding, the focus has been on carefully establishing mathematical models for images, scenes, and objects. In this paper, we propose a novel, nonparametric approach for object recognition and scene parsing using a new technology we name label transfer. For an input image, our system first retrieves its nearest neighbors from a large database containing fully annotated images. Then, the system establishes dense correspondences between the input image and each of the nearest neighbors using the dense SIFT flow algorithm [28], which aligns two images based on local image structures. Finally, based on the dense scene correspondences obtained from SIFT flow, our system warps the existing annotations and integrates multiple cues in a Markov random field framework to segment and recognize the query image. Promising experimental results have been achieved by our nonparametric scene parsing system on challenging databases. Compared to existing object recognition approaches that require training classifiers or appearance models for each object category, our system is easy to implement, has few parameters, and embeds contextual information naturally in the retrieval/alignment procedure.
Keywords :
Markov processes; feature extraction; image recognition; image retrieval; object recognition; ubiquitous computing; visual databases; Markov random field framework; contextual information; dense SIFT flow algorithm; image database; image understanding; label transfer; local image structure; mathematical model; nearest neighbor; nonparametric scene parsing system; object category; object recognition; query image recognition; retrieval-alignment procedure; Databases; Histograms; Labeling; Markov processes; Object recognition; Visualization; Markov random fields.; Object recognition; SIFT flow; label transfer; scene parsing;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2011.131
Filename :
5936073
Link To Document :
بازگشت