• DocumentCode
    1261900
  • Title

    Harmonic surface acoustic waves on gallium nitride thin films

  • Author

    Justice, J. ; Lee, K. ; Korakakis, D.

  • Author_Institution
    Lane Department of Computer Science and Electrical Engineering, West Virginia University, Morgantown, WV
  • Volume
    59
  • Issue
    8
  • fYear
    2012
  • fDate
    8/1/2012 12:00:00 AM
  • Firstpage
    1806
  • Lastpage
    1811
  • Abstract
    SAW devices operating at the fundamental frequency and the 5th, 7th, 9th, and 11th harmonics have been designed, fabricated, and measured. Devices were fabricated on GaN thin films on sapphire substrates, which were grown via metal organic vapor phase epitaxy (MOVPE). Operating frequencies of 230, 962, 1338, 1720, and 2100 MHz were achieved with devices that had a fundamental wavelength, /spl lambda/0 = 20 /spl mu/m. Gigahertz operation is realized with relatively large interdigital transducers that do not require complicated submicrometer fabrication techniques. SAW devices fabricated on the GaN/sapphire bilayer have an anisotropic propagation when the wavelength is longer than the GaN film thickness. It is shown that for GaN thin films, where khGaN > 10 (k = 2/spl pi///spl lambda/ and hGaN = GaN film thickness), effects of the substrate on the SAW propagation are eliminated. Bulk mode suppression at harmonic operation is also demonstrated.
  • Keywords
    Acoustic waves; Films; Gallium nitride; Harmonic analysis; Substrates; Surface acoustic wave devices;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2012.2385
  • Filename
    6264144