• DocumentCode
    1261938
  • Title

    Field-anneal effects on magnetic and magnetoresistive properties of Fe-Mn, Ir-Mn and NiO spin valves

  • Author

    Lin, Tsann ; Mauri, Daniele

  • Author_Institution
    Storage Syst. Div., IBM Corp., San Jose, CA, USA
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    2607
  • Lastpage
    2609
  • Abstract
    Spin valves with a Co film as a reference layer and with antiferromagnetic Fe-Mn, Ir-Mn and NiO films as pinning layers were deposited in a DC magnetron sputtering system, and annealed in a field parallel, perpendicular or antiparallel to the easy aids of the reference layer. After anneal, their ferromagnetic coupling and unidirectional anisotropy fields, as well as anisotropy and giant magnetoresistance coefficients were characterized at room temperature. Four critical temperatures were determined from variations of these properties with anneal temperatures. These spin valves were evaluated based on these properties and critical temperatures. Approaches to improvements of these spin valves for uses as read sensors were discussed
  • Keywords
    antiferromagnetic materials; giant magnetoresistance; iridium alloys; iron alloys; magnetic anisotropy; magnetic annealing; magnetic heads; manganese alloys; nickel compounds; spin valves; sputtered coatings; Co; Co film reference layer; DC magnetron sputtering; Fe-Mn; Ir-Mn; NiO; anisotropy coefficient; antiferromagnetic film pinning layer; critical temperature; ferromagnetic coupling; field annealing; giant magnetoresistance coefficient; magnetic properties; magnetoresistive properties; read sensor; spin valve; unidirectional anisotropy field; Annealing; Antiferromagnetic materials; Magnetic anisotropy; Magnetic films; Magnetic properties; Magnetoresistance; Perpendicular magnetic anisotropy; Spin valves; Sputtering; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800908
  • Filename
    800908