Title :
A double underlayer for Co-based longitudinal recording thin film media
Author :
Lee, T.D. ; Hong, S.Y. ; Bae, Seung-Young ; Shin, K.H.
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fDate :
9/1/1999 12:00:00 AM
Abstract :
Magnetic and recording characteristics of CoCrPt thin film media deposited on Cr75Ti25/CoTi double underlayers were investigated and compared to those on bare CoTi or Cr underlayer. Higher coercivity and improved SNR property were obtained compared to media that had CoTi or Cr underlayer. Transmission electron microscopy analysis showed that the crystal grain size and grain size distribution in the magnetic layer were reduced when the Cr75Ti25 /CoTi double layer was used as underlayer. Furthermore, from the delta-M and magnetic force microscopy analyses, it was found that CoCrPt/Cr75Ti25/CoTi triple layered thin films had higher magnetic decoupling of neighboring grains than that of CoCrPt deposited on CoTi or Cr underlayer
Keywords :
chromium alloys; cobalt alloys; coercive force; grain size; magnetic force microscopy; magnetic recording; magnetic recording noise; magnetic thin films; platinum alloys; transmission electron microscopy; CoCrPt; CoCrPt thin film; Cr75Ti25-CoTi; Cr75Ti25/CoTi double underlayer; SNR; coercivity; delta-M curve; grain size; longitudinal magnetic recording; magnetic decoupling; magnetic force microscopy; transmission electron microscopy; Chromium; Coercive force; Electrons; Grain size; Magnetic analysis; Magnetic films; Magnetic force microscopy; Magnetic recording; Sputtering; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
