A double underlayer for Co-based longitudinal recording thin film media

Author

Lee, T.D. ; Hong, S.Y. ; Bae, Seung-Young ; Shin, K.H.

Author_Institution

Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea

Volume

35

Issue

5

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

2628

Lastpage

2633

Abstract

Magnetic and recording characteristics of CoCrPt thin film media deposited on Cr₇₅Ti₂₅/CoTi double underlayers were investigated and compared to those on bare CoTi or Cr underlayer. Higher coercivity and improved SNR property were obtained compared to media that had CoTi or Cr underlayer. Transmission electron microscopy analysis showed that the crystal grain size and grain size distribution in the magnetic layer were reduced when the Cr₇₅Ti₂₅/CoTi double layer was used as underlayer. Furthermore, from the delta-M and magnetic force microscopy analyses, it was found that CoCrPt/Cr₇₅Ti₂₅/CoTi triple layered thin films had higher magnetic decoupling of neighboring grains than that of CoCrPt deposited on CoTi or Cr underlayer

Keywords

chromium alloys; cobalt alloys; coercive force; grain size; magnetic force microscopy; magnetic recording; magnetic recording noise; magnetic thin films; platinum alloys; transmission electron microscopy; CoCrPt; CoCrPt thin film; Cr₇₅Ti₂₅-CoTi; Cr₇₅Ti₂₅/CoTi double underlayer; SNR; coercivity; delta-M curve; grain size; longitudinal magnetic recording; magnetic decoupling; magnetic force microscopy; transmission electron microscopy; Chromium; Coercive force; Electrons; Grain size; Magnetic analysis; Magnetic films; Magnetic force microscopy; Magnetic recording; Sputtering; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.800919

Filename

800919