The impact of a nonideal return path on differential signal integrity

Author

Fornberg, Per E. ; Kanda, Mark ; Lasek, Christopher ; Piket-May, Melinda ; Hall, Stephen H.

Author_Institution

Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA

Volume

44

Issue

1

fYear

2002

fDate

2/1/2002 12:00:00 AM

Firstpage

11

Lastpage

15

Abstract

Printed circuit board transmission lines propagating high-speed digital signals are susceptible to nonideal return paths which may affect signal integrity. In an attempt to clarify this complex issue, this paper presents a study of differential signal integrity issues for the familiar situation in which two coupled microstrip traces are in close proximity to a common reference plane. Differential signaling on coupled microstrip lines and stripline configurations are investigated. Finite-difference time domain simulations are used to demonstrate the impact a nonideal return path can have on differential signal integrity

Keywords

electromagnetic coupling; electromagnetic interference; finite difference time-domain analysis; microstrip lines; printed circuits; transmission line theory; common reference plane; coupled microstrip traces; differential signal integrity; finite-difference time domain simulations; high-speed digital signals; nonideal return path; printed circuit board transmission lines; stripline configurations; Degradation; Distributed parameter circuits; Electromagnetic compatibility; Electromagnetic interference; Finite difference methods; Geometry; Inductance; Microstrip; Printed circuits; Transmission lines;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/15.990705

Filename

990705