Comparison between different methods of determining anisotropy constants of thin film media

Author

Inaba, N. ; Uesaka, Y. ; Futamoto, M.

Author_Institution

Central Res. Lab., Hitachi Ltd., Tokyo, Japan

Volume

35

Issue

5

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

2670

Lastpage

2672

Abstract

The magnetic anisotropy K_u value of Co₈₁Cr ₁₅Ta₄ polycrystalline thin film medium was determined by using the 45 degree magneto-torque and the rotational hysteresis methods and compared with those of Co-Cr-Ta single crystal films with different Cr contents. The anisotropy field H_k of polycrystalline specimen determined by the rotational hysteresis method is confirmed to be underestimated. The K_u of the Co-Cr-Ta polycrystalline film determined by using the 45 degree magneto-torque method showed a reasonable agreement with that estimated from the single crystal specimen by taking into account of the Cr segregation in the polycrystalline grains

Keywords

chromium alloys; cobalt alloys; magnetic anisotropy; magnetic hysteresis; magnetic thin films; segregation; tantalum alloys; torque; Co-Cr-Ta; Co-Cr-Ta single crystal film; Co₈₁Cr₁₅Ta₄; Co₈₁Cr₁₅Ta₄ polycrystalline thin film; compositional segregation; magnetic torque; magnetocrystalline anisotropy constant measurement; rotational hysteresis loss; Anisotropic magnetoresistance; Magnetic analysis; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Perpendicular magnetic anisotropy; Saturation magnetization; Substrates; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.800942

Filename

800942