DocumentCode :
1262104
Title :
Time-domain modeling, characterization, and measurements of anechoic and semi-anechoic electromagnetic test chambers
Author :
Holloway, Christopher L. ; McKenna, Paul M. ; Dalke, Roger A. ; Perala, Rodney A. ; Devor, Charles L., Jr.
Author_Institution :
U.S. Dept. of Commerce, Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
44
Issue :
1
fYear :
2002
fDate :
2/1/2002 12:00:00 AM
Firstpage :
102
Lastpage :
118
Abstract :
We present time-domain techniques for modeling, characterizing, and measuring anechoic and semi-anechoic chambers used for emission and immunity testing of digital devices. The finite difference time-domain (FDTD) approach is used to model and characterize these chambers. In the FDTD model presented here, we discuss methods used to eliminate the need to spatially resolve the fine detail of the absorbing structures; present a differential-operator approach for incorporating both frequency-dependent permittivity and permeability into the time domain; and discuss the effects of gaps and holes in ferrite-tile absorbers on both absorber and chamber performance. Comparisons of the FDTD chamber model with measured data for different chamber sizes are presented. Finally, we discuss and illustrate how time-domain techniques can be used to characterize chambers, predict performance, and diagnose problems with both absorbers and chambers. With time-domain and frequency-domain techniques, we show how the performance of chambers can be significantly altered with only small changes in the type of absorbing structure used, and we illustrate how undesirable modal field distributions can occur inside a chamber when a nonoptimal absorber is used
Keywords :
anechoic chambers (electromagnetic); electromagnetic compatibility; electromagnetic interference; electromagnetic wave absorption; ferrites; finite difference time-domain analysis; EMC; EMI; FDTD chamber model; absorber performance; absorbing structures; anechoic EM test chambers; anechoic electromagnetic test chambers; chamber performance; chamber sizes; differential-operator; digital devices; electromagnetic compatibility; electromagnetic interference; emission testing; ferrite-tile absorbers; finite difference time-domain; frequency-dependent permeability; frequency-dependent permittivity; frequency-domain techniques; gaps; holes; immunity testing; modal field distributions; nonoptimal absorber; semi-anechoic EM test chambers; semi-anechoic electromagnetic test chambers; time-domain modeling; time-domain techniques; Dielectric losses; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic modeling; Electromagnets; Finite difference methods; Frequency; Immunity testing; Time domain analysis;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.990716
Filename :
990716
Link To Document :
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