DocumentCode :
1262169
Title :
Thermal fluctuation of magnetization in nanocrystalline FePt thin films with high coercivity
Author :
Shimatsu, T. ; Lodder, J.C. ; Sugita, Y. ; Nakamura, Y.
Author_Institution :
Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
Volume :
35
Issue :
5
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
2697
Lastpage :
2699
Abstract :
The effect of thermal fluctuations of magnetization on static and dynamic properties is discussed for nanocrystalline FePt films. The large magnetocrystalline anisotropy Ku of L10 type FePt results in large KuV/(kT) values of more than 70 even for very fine grain sizes of 7-8 nm, indicating the potential of this alloy film to resist thermal fluctuation of magnetization. It is successfully demonstrated that larger KuV/(kT) values of these films lead to lower magnetic viscosity. Annealing at higher temperature results in larger KuV/kT values and smaller Vact. The remanent coercivity measured at high sweep rate by using pulsed magnetic fields indicates the high thermal stability of these alloy films at high frequencies. However, the results indicated that care should be taken to induce an adequate magnitude of Ku for the FePt alloy to be used as ultrahigh density recording media
Keywords :
coercive force; ferromagnetic materials; grain size; iron alloys; magnetic anisotropy; magnetic recording; magnetic thin film devices; magnetic thin films; platinum alloys; thermal stability; FePt; anisotropy; grain sizes; magnetic viscosity; magnetization; nanocrystalline thin films; pulsed magnetic fields; remanent coercivity; sweep rate; thermal fluctuation; thermal stability; ultrahigh density recording media; Anisotropic magnetoresistance; Fluctuations; Grain size; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic properties; Magnetization; Perpendicular magnetic anisotropy; Pulse measurements;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.800956
Filename :
800956
Link To Document :
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