• DocumentCode
    1262184
  • Title

    An accelerated test for cobalt migration in thin-film rigid disks

  • Author

    Lin, Moon-Sun ; Tsai, Changdar ; Sun, YaChun ; Huang, Ward ; Wang, C.M. ; Dong, Charles

  • Author_Institution
    Trace Storage Technol. Co., Hsinchu, Taiwan
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    2703
  • Lastpage
    2705
  • Abstract
    An accelerated direct extraction test was developed to evaluate the cobalt migration in thin film rigid disk. The results obtained using this test show good correlation to the results from the conventional chamber exposure test at 60°C, 70°C, and 80°C with 80% RH for 96 hours
  • Keywords
    cobalt; hard discs; life testing; magnetic thin film devices; 60 to 80 C; Co; accelerated direct extraction test; chamber exposure test; cobalt migration; thin film rigid disk; Atomic force microscopy; Cobalt; Corrosion; Life estimation; Magnetic heads; Plasma temperature; Scanning electron microscopy; Surface morphology; Testing; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800958
  • Filename
    800958
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1262184