Title :
Case study of media noise mechanisms in longitudinal recording
Author :
Yen, E.T. ; Wu, S.Z. ; Thomson, T. ; Ristau, R. ; Ranjan, Rajiv ; Rauch, G.C.
Author_Institution :
Seagate Recording Media, Fremont, CA
fDate :
9/1/1999 12:00:00 AM
Abstract :
A comprehensive study (TEM, MFM, AFM, XRD, recording performance and magnetometry) of media noise mechanisms and their relation to grain structure is reported for model, high noise contrast, CoCrPtTa thin films. The CoCrPtTa media were sputtered on to either CrMn or NiAl/CrMn underlayers causing a change in media noise power of 9 dB, The changes in media noise are not related to the topography of the underlayer(s) or due to interaction effects, which the δM technique suggests are negligible in these model samples, A quantitative correlation is obtained between magnetic cluster size and media noise using an analytical first approximation of Zhou and Bertram´s micromagnetic model
Keywords :
X-ray diffraction; atomic force microscopy; chromium alloys; cobalt alloys; ferromagnetic materials; magnetic force microscopy; magnetic recording noise; magnetic thin film devices; magnetic thin films; magnetometers; platinum alloys; tantalum alloys; transmission electron microscopy; AFM; CoCrPtTa-CrMn; CoCrPtTa-NiAl-CrMn; MFM; TEM; XRD; grain structure; longitudinal recording; magnetic cluster size; magnetometry; media noise mechanisms; media noise power; micromagnetic model; noise contrast; quantitative correlation; recording performance; Computer aided software engineering; Magnetic analysis; Magnetic force microscopy; Magnetic noise; Magnetic properties; Magnetic recording; Micromagnetics; Noise measurement; Sputtering; Substrates;
Journal_Title :
Magnetics, IEEE Transactions on
