• DocumentCode
    1262401
  • Title

    Thermal stability of magnetic recording in perpendicular thin film media

  • Author

    Futamoto, Masaaki ; Hirayama, Yuzo ; Inaba, Nobuyuki ; Honda, Y. ; Ito, K. ; Kikugawa, A. ; Takeuchi, T.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    2802
  • Lastpage
    2807
  • Abstract
    Recording and signal decay characteristics of perpendicular CoCr-alloy thin film media are investigated in comparison with those of longitudinal media. A perpendicular medium shows recording resolution 25-32% higher than that of a longitudinal medium with similar low density output. The medium S/N of a 25 nm thick perpendicular medium is comparable to that of a 16 nm thick CoCrPt longitudinal medium at high linear densities. The signal decay rate of the high Mr/Ms perpendicular medium is below 0.2% per decade of time for all linear densities. These results and thermal stability considerations based on the temperature dependence of KuV/kT indicate that CoCr-alloy perpendicular recording media are promising to extend the linear density well beyond 400 kFCI
  • Keywords
    chromium alloys; cobalt alloys; ferromagnetic materials; hard discs; magnetic recording noise; magnetic thin films; magnetocaloric effects; perpendicular magnetic recording; thermal stability; 25 nm; CoCr; high Mr/Ms perpendicular medium; linear density; low density output; magnetic recording; perpendicular CoCr-alloy thin film media; perpendicular medium; perpendicular thin film media; recording resolution; signal decay characteristics; signal decay rate; signal/noise ratio; temperature dependence; thermal stability; Crystallization; Indium tin oxide; Magnetic films; Magnetic heads; Magnetic noise; Magnetic recording; Perpendicular magnetic recording; Sputtering; Thermal stability; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800989
  • Filename
    800989