• DocumentCode
    1262478
  • Title

    Room-temperature and low-field magnetoresistance of La-Sr-Mn-O thin films

  • Author

    Choi, Kyung-Ku ; Taniyama, Tomoyasu ; Yamazaki, Yohtaro

  • Author_Institution
    Dept. of Innovative & Eng. Mater., Tokyo Inst. of Technol., Japan
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    2844
  • Lastpage
    2846
  • Abstract
    Thin films of La0.71Sr0.29Mn1.01O 3-δ have been sputtered onto polycrystalline YSZ, (110) sapphire, YSZ buffered Si and (100) SrTiO3 substrates. Microstructure and magnetotransport properties of these films are investigated. Except for the epitaxial film on (100) SrTiO3 substrate, granular structures with 20-100 nm grains in size are observed. In the granular films, resistance changes about 0.5% within a field of 100 Oe are observed at room-temperature. The resistivity and the hysteretic behavior of the magnetoresistance are varied with substrate material. The low-field magnetoresistance is related to the microstructure and the magnetization process
  • Keywords
    colossal magnetoresistance; ferromagnetic materials; grain size; granular materials; lanthanum compounds; magnetic epitaxial layers; magnetic thin films; magnetisation; nanostructured materials; sputtered coatings; strontium compounds; (100) SrTiO3 substrates; (110) sapphire; 20 to 100 nm; Al2O3; La-Sr-Mn-O thin films; La0.71Sr0.29Mn1.01O 3-δ; La0.71Sr0.29Mn1.01O3; Si; SrTiO3; Y2O3-ZrO2; YSZ buffered Si; epitaxial film; grain size; granular structures; hysteretic behavior; low-field magnetoresistance; magnetization process; magnetotransport properties; microstructure; polycrystalline YSZ; resistance changes; room-temperature; sputtered film; Conductivity; Hysteresis; Magnetic materials; Magnetic properties; Magnetoresistance; Microstructure; Semiconductor thin films; Sputtering; Strontium; Substrates;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800999
  • Filename
    800999