• DocumentCode
    1262652
  • Title

    High-Frequency Ballistic Transport Phenomena in Schottky Barrier CNTFETs

  • Author

    Claus, Martin ; Blawid, Stefan ; Mothes, Sven ; Schröter, Michael

  • Author_Institution
    Dept. of Electr. Eng. & Inf. Technol., Tech. Univ. Dresden, Dresden, Germany
  • Volume
    59
  • Issue
    10
  • fYear
    2012
  • Firstpage
    2610
  • Lastpage
    2618
  • Abstract
    The effective-mass Schrödinger equation is solved directly for the wave functions to explore the steady state and the time-dependent quantum-ballistic transport in Schottky barrier carbon nanotube (CNT) field-effect transistors (FETs). The employed contact parameters allow for discontinuities of the effective mass at the metal-CNT interface, and carefully chosen boundary conditions minimize spurious reflections at the simulation domain boundaries. Two-port Y-parameters of a selected device structure are computed and qualitatively explained with the time dependence of coherent quantum-ballistic charge injection. The finite escape times of the charge carriers in an open quantum system are identified for determining the inertial response to high-frequency terminal signals. Since the escape times depend on the shape of the Schottky barriers, the latter contribute to the dynamic behavior of ballistic CNTFETs.
  • Keywords
    Schottky barriers; Schottky gate field effect transistors; Schrodinger equation; ballistic transport; carbon nanotube field effect transistors; charge injection; wave functions; C; Schottky barrier CNTFET; Schottky barrier carbon nanotube held-effect transistor; boundary conditions; coherent quantum-ballistic charge injection; effective-mass Schrodinger equation; high-frequency ballistic transport phenomena; high-frequency terminal signal; metal-CNT interface; time-dependent quantum-ballistic transport; two-port Y-parameters; wave functions; CNTFETs; Effective mass; Electron tubes; Equations; Mathematical model; Schottky barriers; Steady-state; Ballistic transport; carbon nanotube field-effect transistor (CNTFET); escape time; high-frequency (HF) behavior; nonquasi-static (NQS) phenomena;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2207725
  • Filename
    6265385