• DocumentCode
    1262678
  • Title

    Scattering matrix approach to STW resonators

  • Author

    Soluch, Waldemar

  • Author_Institution
    Inst. of Electron. Mater. Technol., Warsaw, Poland
  • Volume
    49
  • Issue
    3
  • fYear
    2002
  • fDate
    3/1/2002 12:00:00 AM
  • Firstpage
    327
  • Lastpage
    330
  • Abstract
    The scattering matrix method was used for the analysis of surface transverse wave (STW) resonators on quartz. An expression for the transfer function of the resonators with different numbers of electrodes in the reflectors was derived. It was found that, for a proper ratio of these numbers, the spurious signal level below the resonance frequency can be lowered. The STW resonator for the frequency near 1090 MHz was designed, fabricated, and measured. By matching the measured and calculated transfer functions, the velocity, the electromechanical coupling coefficient, and the reflection coefficient of one aluminium strip of the STW on the 36/spl deg/Y-cut quartz were determined. The insertion loss about 7 dB, loaded quality coefficient near 4200, and the spurious signal level about 5 dB lower compared with the resonance one were obtained for the resonator.
  • Keywords
    Q-factor; S-matrix theory; surface acoustic wave resonators; transfer functions; 1090 MHz; 7 dB; Al; SiO/sub 2/; aluminium strip; electromechanical coupling coefficient; insertion loss; quality coefficient; quartz; reflection coefficient; scattering matrix; spurious signal level; surface transverse wave resonator; transfer function; velocity; Aluminum; Electrodes; Frequency measurement; Reflection; Resonance; Resonant frequency; Scattering; Surface waves; Transfer functions; Velocity measurement; Acoustics; Algorithms; Computer Simulation; Equipment Design; Microwaves; Models, Theoretical; Quartz; Sensitivity and Specificity; Transducers;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.990946
  • Filename
    990946