Title :
Exchange bias: interface imperfections and temperature dependence
Author :
Kim, J.-V. ; Wee, L. ; Stamps, R.L. ; Street, R.
Author_Institution :
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
fDate :
9/1/1999 12:00:00 AM
Abstract :
Calculations are presented showing how exchange bias in antiferromagnet/ferromagnet bilayers can be modified by interface roughness. Effects of steps and line defects are explored for compensated and uncompensated antiferromagnetic interfaces. The angular dependence of the bias field on orientation and interface structure is calculated, and thermal effects related to stability are discussed
Keywords :
antiferromagnetic materials; exchange interactions (electron); ferromagnetic materials; interface roughness; interface structure; magnetic multilayers; angular dependence; antiferromagnet; bias field; bilayers; compensated antiferromagnetic interfaces; exchange bias; ferromagnet; interface imperfections; interface roughness; interface structure; line defects; orientation; stability; steps; temperature dependence; thermal effects; uncompensated antiferromagnetic interfaces; Anisotropic magnetoresistance; Antiferromagnetic materials; Cooling; Elementary particle exchange interactions; Helium; Magnetic field measurement; Nonhomogeneous media; Physics; Temperature dependence; Thermal stability;
Journal_Title :
Magnetics, IEEE Transactions on
