EMI-induced failures in crystal oscillators

Author

Laurin, Jean-Jacques ; Zaky, Safwat G. ; Balmain, Keith G.

Author_Institution

Dept. of Electr. Eng., Toronto Univ., Ont., Canada

Volume

33

Issue

4

fYear

1991

fDate

11/1/1991 12:00:00 AM

Firstpage

334

Lastpage

342

Abstract

An electromagnetic interference (EMI) induced failure mode pertaining to crystal-based voltage-controlled oscillators (VCO) has been studied. The failure consists of a transition to a frequency of oscillation that differs from the crystal´s fundamental resonant frequency, when the circuit is temporarily exposed to continuous or pulsed radio-frequency electromagnetic fields. The new state persists even after the EMI source is removed and leads to hang-up in digital systems. This mode transition has been observed experimentally. Its essential properties have been predicted theoretically and simulated numerically, using simplified oscillator models. The likelihood of observing such a failure in a noisy electromagnetic environment is assessed with respect to the radiated susceptibility levels given in MIL-STD-461B

Keywords

crystal resonators; electrical faults; radiofrequency interference; radiofrequency oscillators; standards; variable-frequency oscillators; EMI-induced failures; MIL-STD-461B; VCO; continuous RF field; crystal-based voltage-controlled oscillators; electromagnetic interference; frequency transition; fundamental resonant frequency; mode transition; pulsed radio-frequency electromagnetic fields; radiated susceptibility levels; EMP radiation effects; Electromagnetic fields; Electromagnetic interference; Predictive models; Pulse circuits; RLC circuits; Radio frequency; Radiofrequency integrated circuits; Resonant frequency; Voltage-controlled oscillators;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/15.99115

Filename

99115