DocumentCode :
1262980
Title :
High frequency measurement of thin film magnetoresistance
Author :
Yoshizawa, N. ; Nakane, H. ; Negishi, T. ; Shimada, Y. ; Hasegawa, T. ; Arai, K.
Author_Institution :
Dept. of Electr. Eng., Kogakuin Univ., Tokyo, Japan
Volume :
35
Issue :
5
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
3058
Lastpage :
3060
Abstract :
A system to measure the high frequency MR curve of thin films was developed. Two problems had to be solved to realize MR measurement at frequencies above several MHz, namely, to produce a high amplitude magnetic field and to develop electrodes less sensitive to inductive high frequency noises than the conventional four probe electrodes. These problems were solved by making use of the resonance of a coil with a ferrite core connected in parallel with to a capacitor, and by contacting patterned thin film electrodes to the sample surface with a suitable pressure. The result was an appreciable reduction of inductive noises. Using the resonance circuit and electrodes we could obtain AMR curves of Permalloy films at frequencies up to 1.8 MHz in a field of 110 Oe pp
Keywords :
Permalloy; electrical conductivity measurement; ferromagnetic materials; high-frequency effects; magnetic thin films; magnetoresistance; random noise; 1.8 MHz; AMR curves; NiFe; Permalloy films; capacitor; ferrite core; high amplitude magnetic field; high frequency MR curve; high frequency measurement; inductive high frequency noise; patterned thin film electrodes; resonance; resonance circuit; thin film; thin film magnetoresistance; Anisotropic magnetoresistance; Electrodes; Frequency measurement; Magnetic field measurement; Magnetic noise; Magnetic resonance; Noise level; Noise measurement; Probes; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.801084
Filename :
801084
Link To Document :
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