Title :
The finite-size scaling in thin ferromagnetic nickel films
Author :
Hong, Sungwook ; Rhee, Ils
Author_Institution :
Dept. of Phys., Kyungpook Nat. Univ., Taegu, South Korea
fDate :
9/1/1999 12:00:00 AM
Abstract :
The Curie point of nickel films has been determined by measuring the resistivity as a function of temperature. From these data, we observe the thickness dependence of Curie point shift in these films; that is, the thinner the film is, the larger the shift is. By analyzing the data in the light of finite-size scaling theory, we determine the shift exponent λ to be 0.92±0.04, not the theoretical value of 1.48. Such a deviation from the theoretical value has also been noted in other papers
Keywords :
Curie temperature; critical exponents; electrical resistivity; ferromagnetic materials; magnetic thin films; metallic thin films; nickel; scaling phenomena; Curie point shift; Ni; film thickness dependence; finite-size scaling; resistivity temperature dependence; shift exponent; thin ferromagnetic films; Automatic control; Conductivity; Glass; Helium; Magnetic confinement; Magnetic films; Nickel; Substrates; Temperature control; Thickness control;
Journal_Title :
Magnetics, IEEE Transactions on
