Title :
Ferromagnetic resonance in CoZr/Ag/CoZr trilayer films
Author :
Baek, J.S. ; Park, Y.J. ; Kim, Y.Y. ; Lim, W.Y. ; Kim, C.O. ; Lee, S.H.
Author_Institution :
Dept. of Phys., Korea Univ., Chochiwon, South Korea
fDate :
9/1/1999 12:00:00 AM
Abstract :
A series of CoZr(200 Å)/Ag(tAg)/CoZr(200 Å) trilayers with Ag interlayer thickness tAg in the range of 10-160 Å was deposited on Si(100) wafers at room temperature by using a magnetron sputtering system. In order to understand the dependence of the magnetic exchange interaction between ferromagnetic Co 84Zr16(at.%) layers separated by nonmagnetic Ag layers on the tAg, we investigated the FMR spectra. The coupling strength increases with increasing tAg up to 20 Å with a maximum value of 2.0 kOe, but decreases rapidly with increasing tAg in the range of 40-100 Å. Finally, the value approaches zero above 120 Å. The coupling strength is positive for all samples
Keywords :
cobalt alloys; exchange interactions (electron); ferromagnetic materials; ferromagnetic resonance; magnetic multilayers; metallic thin films; silver; sputtered coatings; zirconium alloys; 10 to 160 A; Ag interlayer thickness dependence; CoZr-Ag-CoZr; CoZr/Ag/CoZr trilayer films; FMR spectra; Si; Si(100) wafers; coupling strength; ferromagnetic Co84Zr16 layers; ferromagnetic resonance; magnetic exchange interaction; magnetron sputtered films; nonmagnetic Ag layers; Couplings; Elementary particle exchange interactions; Magnetic field measurement; Magnetic materials; Magnetic multilayers; Magnetic resonance; Magnetic separation; Physics; Sputtering; Temperature distribution;
Journal_Title :
Magnetics, IEEE Transactions on
