Title :
Structural and magnetic properties of Fe films epitaxially grown on Pd(001)/Cu(001)/Si(001) by sputtering
Author :
Choi, Tae Won ; Yu, Sung Cho ; Jang, Pyung Woo ; Kim, Won Tae
Author_Institution :
Dept. of Phys., Chung-Buk Nat. Univ., Cheongju, South Korea
fDate :
9/1/1999 12:00:00 AM
Abstract :
5-150 nm Fe(001)/70 nm Pd(001)/85 nm Cu (001) films were epitaxially grown on Si(001) by RF sputtering. Magnetic and structural properties were analyzed by VSM, torque magnetometer and X-ray diffractometer. Epitaxial relationship of Fe(001)[110]||Pd(001)[010]||Cu(001)[010]||Si(001)[110] was confirmed. The hysteresis loops were characteristic of biaxial anisotropy and the anisotropy fields estimated from magnetization curves were in good agreement with the torque data. Uniaxial anisotropy was mixed with biaxial anisotropy in the torque data. Biaxial crystalline anisotropy decreased with decreasing film thickness while uniaxial anisotropy increased. With decreasing film thickness, the direction of uniaxial anisotropy was changed from [100] axis to [110] axis. The origin for the uniaxial anisotropy was the orthorhombic deformation of Fe layer which was more pronounced in thinner films
Keywords :
X-ray diffraction; copper; iron; magnetic anisotropy; magnetic epitaxial layers; magnetic hysteresis; magnetic multilayers; magnetisation; palladium; silicon; sputtered coatings; Fe(001)/Pd(001)/Cu(001)/Si(001); Fe-Pd-Cu-Si; RF sputtered film; Si; X-ray diffraction; biaxial anisotropy; epitaxially grown films; hysteresis loops; magnetic properties; magnetization curves; orthorhombic deformation; structural properties; torque magnetometer; uniaxial anisotropy; Anisotropic magnetoresistance; Iron; Magnetic analysis; Magnetic anisotropy; Magnetic films; Magnetic properties; Perpendicular magnetic anisotropy; Radio frequency; Sputtering; Torque;
Journal_Title :
Magnetics, IEEE Transactions on
