• DocumentCode
    1263686
  • Title

    Average optical power monitoring in micromirrors

  • Author

    Supino, Ryan N. ; Talghader, Joseph J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    8
  • Issue
    1
  • fYear
    2002
  • Firstpage
    12
  • Lastpage
    18
  • Abstract
    The thermal properties of tip-tilt micromirrors have been analyzed theoretically and measured experimentally for devices operated in air and in vacuum. Typical micromirror thermal conductances are shown to range from 10-3 W/K for devices operated close to the substrate in air to 10-5 W/K for devices operated in a vacuum. These results demonstrate that micromirror temperatures are extremely sensitive to the average optical signal incident upon them and can be used as probes of incident power in much the same way as thermal infrared detectors. This has been experimentally demonstrated using a λ = 661 nm diode laser with polysilicon micromirrors, and sensitivities reaching below 70 nW of absorbed optical power, limited by the Johnson and 1/f noise of the micromirrors and measurement system. Average optical power monitoring could be useful in large cross connects or other applications, where the additional integration of a tap/beamsplitter plus photodiode assembly is undesirable
  • Keywords
    1/f noise; heat conduction; infrared detectors; micro-optics; mirrors; monitoring; optical noise; optical sensors; probes; 1/f noise; 661 nm; 70 nW; Johnson noise; absorbed optical power; average optical power monitoring; average optical signal; diode laser; incident power probes; measurement system; micromirror temperatures; micromirror thermal conductances; micromirrors; polysilicon micromirrors; substrate; thermal infrared detectors; thermal properties; tip-tilt micromirrors; Adaptive optics; Infrared detectors; Micromirrors; Monitoring; Optical noise; Optical sensors; Probes; Temperature sensors; Thermal conductivity; Ultraviolet sources;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/2944.991394
  • Filename
    991394