Title :
Average optical power monitoring in micromirrors
Author :
Supino, Ryan N. ; Talghader, Joseph J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
The thermal properties of tip-tilt micromirrors have been analyzed theoretically and measured experimentally for devices operated in air and in vacuum. Typical micromirror thermal conductances are shown to range from 10-3 W/K for devices operated close to the substrate in air to 10-5 W/K for devices operated in a vacuum. These results demonstrate that micromirror temperatures are extremely sensitive to the average optical signal incident upon them and can be used as probes of incident power in much the same way as thermal infrared detectors. This has been experimentally demonstrated using a λ = 661 nm diode laser with polysilicon micromirrors, and sensitivities reaching below 70 nW of absorbed optical power, limited by the Johnson and 1/f noise of the micromirrors and measurement system. Average optical power monitoring could be useful in large cross connects or other applications, where the additional integration of a tap/beamsplitter plus photodiode assembly is undesirable
Keywords :
1/f noise; heat conduction; infrared detectors; micro-optics; mirrors; monitoring; optical noise; optical sensors; probes; 1/f noise; 661 nm; 70 nW; Johnson noise; absorbed optical power; average optical power monitoring; average optical signal; diode laser; incident power probes; measurement system; micromirror temperatures; micromirror thermal conductances; micromirrors; polysilicon micromirrors; substrate; thermal infrared detectors; thermal properties; tip-tilt micromirrors; Adaptive optics; Infrared detectors; Micromirrors; Monitoring; Optical noise; Optical sensors; Probes; Temperature sensors; Thermal conductivity; Ultraviolet sources;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.991394