DocumentCode :
1263753
Title :
Optomechanical model of surface micromachined tunable optoelectronic devices
Author :
Lin, Chien-chung ; Martin, Wayne A. ; Harris, James S., Jr.
Author_Institution :
Solid State & Photonics Lab., Stanford Univ., CA, USA
Volume :
8
Issue :
1
fYear :
2002
Firstpage :
80
Lastpage :
87
Abstract :
Linewidth is a critical performance parameter for many optoelectronic devices. We have developed a combined optical and mechanical simulation tool and demonstrate its application to micromachined vertical-cavity tunable optoelectronic devices. The deformation of the mirror surface is calculated from the area moment method. The optical field distribution is calculated by the Fox-Li method, and the diffraction losses are estimated from second-order perturbation theory. By comparison to experimental results, we find that the deformation of the central plate is well predicted by our theory. While deformation can be a major source of linewidth broadening in MEMS tunable optoelectronic devices, it is not the primary source in our devices
Keywords :
integrated optoelectronics; light diffraction; micro-optics; micromachining; mirrors; optical design techniques; optical losses; optical tuning; perturbation theory; semiconductor device models; spectral line broadening; Fox-Li method; MEMS tunable optoelectronic devices; area moment method; central plate; deformation; diffraction losses; linewidth broadening; mechanical simulation tool; micromachined vertical-cavity tunable optoelectronic devices; mirror surface; optical field distribution; optoelectronic devices; optomechanical model; performance parameter; second-order perturbation theory; surface micromachined tunable optoelectronic devices; Biomembranes; Mirrors; Optical diffraction; Optical filters; Optical losses; Optical modulation; Optical resonators; Optical surface waves; Optoelectronic devices; Tunable circuits and devices;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/2944.991402
Filename :
991402
Link To Document :
بازگشت