• DocumentCode
    1263844
  • Title

    Focused local learning with wavelet neural networks

  • Author

    Rying, Eric A. ; Bilbro, Griff L. ; Lu, Jye-Chyi

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
  • Volume
    13
  • Issue
    2
  • fYear
    2002
  • fDate
    3/1/2002 12:00:00 AM
  • Firstpage
    304
  • Lastpage
    319
  • Abstract
    A novel objective function is presented that incorporates both local and global errors as well as model parsimony in the construction of wavelet neural networks. Two methods are presented to assist in the minimization of this objective function, especially the local error term. First, during network initialization, a locally adaptive grid is utilized to include candidate wavelet basis functions whose local support addresses the local error of the local feature set. This set can be either user-defined or determined using information derived from the wavelet transform modulus maxima representation. Next, during the network construction, a new selection procedure based on a subspace projection operator is presented to help focus the selection of wavelet basis functions to reduce the local error. Simulation results demonstrate the effectiveness of these methodologies in minimizing local and global error while maintaining model parsimony and incurring a minimal increase on computational complexity
  • Keywords
    computational complexity; learning (artificial intelligence); minimisation; neural nets; adaptive grid; computational complexity; global error; local error; local learning; minimization; objective function; subspace projection; wavelet basis functions; wavelet neural networks; wavelet transform modulus maxima; Artificial intelligence; Artificial neural networks; Computational complexity; Computational modeling; Frequency; Intelligent sensors; Machine learning; Minimization methods; Neural networks; Wavelet transforms;
  • fLanguage
    English
  • Journal_Title
    Neural Networks, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1045-9227
  • Type

    jour

  • DOI
    10.1109/72.991417
  • Filename
    991417