Title :
Stresses on Grounding Switches During Opening
Author :
Habedank, U. ; Luehrmann, H.M.
Author_Institution :
SIEMENS AG, Berlin, Germany
fDate :
5/1/1985 12:00:00 AM
Keywords :
Circuit testing; Gas insulation; Grounding; Inductance; Power system transients; Stress; Switches; System testing; Transient analysis; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1985.5526588
