DocumentCode :
1264670
Title :
An in-system reprogrammable 32 K×8 CMOS flash memory
Author :
Kynett, Virgil Niles ; Baker, Alan ; Fandrich, Mick Lee ; Hoekstra, George P. ; Jungroth, Owen ; Kreifels, Jerry A. ; Wells, Steven ; Winston, Mark D.
Author_Institution :
Intel Corp., Folsom, CA, USA
Volume :
23
Issue :
5
fYear :
1988
fDate :
10/1/1988 12:00:00 AM
Firstpage :
1157
Lastpage :
1163
Abstract :
The authors describe the design and performance of a 192-mil2 256 K (32 K×8) flash memory targeted for in-system reprogrammable applications. Developed from a 1.5 μm EPROM base technology with a one-transistor 6×6-μm2 cell, the device electrically erases all cells in the array matrix in 200 ms and electrically programs at the rate of 100 μs/byte typical. The read performance is equivalent to comparable-density CMOS EPROM devices with a chip-enable access time of 110 ns at 30-mA active current consumption. A command-port interface facilitates microprocessor-controlled reprogramming capability. Device reliability has been increased over byte-alterable EEPROMs by reducing the program power supply to 12 V. Cycling endurance experiments have demonstrated that the device is capable of more than 10000 erase/program cycles
Keywords :
CMOS integrated circuits; EPROM; circuit reliability; integrated memory circuits; 1.4 to 1.5 micron; 100 mus; 110 ns; 12 V; 200 ms; 256 kbit; 30 mA; CMOS; active current consumption; chip-enable access time; command-port interface; cycling endurance; erase time; flash memory; in system reprogrammability; in-system reprogrammable applications; microprocessor-controlled reprogramming capability; program power supply; program time; reliability; CMOS technology; EPROM; Flash memory; Lithography; Microcontrollers; Microprocessors; Nonvolatile memory; Power supplies; Secondary generated hot electron injection; Timing;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.5938
Filename :
5938
Link To Document :
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