Title :
Mutual information-based feature extraction on the time-frequency plane
Author :
Grall-Maës, Edith ; Beauseroy, Pierre
Author_Institution :
Lab. de Modelisation et Surete des Systemes, Univ. de Technologie de Troyes, France
fDate :
4/1/2002 12:00:00 AM
Abstract :
A method is proposed for automatic extraction of effective features for class separability. It applies to nonstationary processes described only by sample sets of stochastic signals. The extraction is based on time-frequency representations (TFRs) that are potentially suited to the characterization of nonstationarities. The features are defined by parameterized mappings applied to a TFR. These mappings select a region of the time-frequency plane by using a two-dimensional (2-D) parameterized weighting function and provide a standard characteristic in the restricted representation obtained. The features are automatically drawn from the TFR by tuning the weighting function parameters. The extraction is driven to maximize the information brought by the features about the class membership. It uses a mutual information criterion, based on estimated probability distributions. The framework is developed for the extraction of a single feature and extended to several features. A classification scheme adapted to the extracted features is proposed. Finally, some experimental results are given to demonstrate the efficacy of the method
Keywords :
feature extraction; signal classification; time-frequency analysis; automatic extraction; class membership; class separability; classification scheme; estimated probability distributions; extracted features; mutual information criterion; mutual information-based feature extraction; nonstationarities; nonstationary processes; stochastic signals; time-frequency plane; two-dimensional parameterized weighting function; weighting function parameters; Data mining; Feature extraction; Mutual information; Probability density function; Random processes; Robustness; Signal processing; Stochastic processes; Time frequency analysis; Two dimensional displays;
Journal_Title :
Signal Processing, IEEE Transactions on