DocumentCode
1264716
Title
In-sawing-lane multi-level BIST for known good dies of LCD drivers
Author
Wang, Chua-Chin ; Wu, Chi-Feng ; Chen, Sheng-Hua ; Kao, Chia-Hsiung
Author_Institution
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Volume
35
Issue
18
fYear
1999
fDate
9/2/1999 12:00:00 AM
Firstpage
1543
Lastpage
1544
Abstract
Liquid crystal display (LCD) drivers usually operate at low speed, and have a low input-count but high output-count with multilevel voltages. A novel built-in-self-test (BIST) method for LCD drivers is proposed to reduce testing costs. This BIST circuit will be placed in the sawing lanes to reduce the chip area. The chip overhead and the testing costs are reduced, while the test coverage can be maintained
Keywords
built-in self test; driver circuits; integrated circuit layout; integrated circuit testing; liquid crystal displays; KGD; LCD drivers; built-in-self-test method; in-sawing-lane BIST; known good dies; liquid crystal display drivers; multilevel BIST; multilevel voltages;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19991057
Filename
802789
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