• DocumentCode
    1265208
  • Title

    Electromagnetic scattering analysis of coated conductors with edges using the method of auxiliary sources (MAS) in conjunction with the standard impedance boundary condition (SIBC)

  • Author

    Anastassiu, Hristos T. ; Kaklamani, Dimitra I. ; Economou, Dimitrios P. ; Breinbjerg, Olav

  • Author_Institution
    Inst. of Commun. & Comput. Syst., Athens Nat. Tech. Univ., Greece
  • Volume
    50
  • Issue
    1
  • fYear
    2002
  • fDate
    1/1/2002 12:00:00 AM
  • Firstpage
    59
  • Lastpage
    66
  • Abstract
    A novel combination of the method of auxiliary sources (MAS) and the standard impedance boundary condition (SIBC) is employed in the analysis of transverse magnetic (TM) plane wave scattering from infinite, coated, perfectly conducting cylinders with square cross sections. The scatterer is initially modeled by a SIBC surface and the scattering mechanism is subsequently analyzed via MAS. Although SIBC as well as MAS possess theoretical limitations with regard to an edge, the numerical results show that the MAS/SIBC method provides results of high accuracy for a range of structures with edges. The SIBC modeling of coated conductors with edges has previously been investigated in the literature and thus, this work focuses on comparing MAS and the method of moments (MoM) for SIBC surfaces (MoM/SIBC). A detailed complexity analysis shows that the MAS/SIBC method is, under certain conditions, more efficient than the MoM/SIBC method, proving that the proposed novel combination is a powerful and advantageous computational tool
  • Keywords
    conducting bodies; electric impedance; electromagnetic wave scattering; method of moments; MAS; MAS/SIBC; MoM/SIBC; SIBC; coated conductors; cross sections; edges; electromagnetic scattering analysis; method of auxiliary sources; method of moments; standard impedance boundary condition; transverse magnetic plane wave scattering; Boundary conditions; Boundary value problems; Conductors; Electromagnetic analysis; Electromagnetic radiation; Electromagnetic scattering; Helium; Magnetic analysis; Moment methods; Surface impedance;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.992562
  • Filename
    992562